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 HCF4076B
4 BIT D TYPE REGISTERS
s s
s
s s
s s
s s
THREE STATE OUTPUTS INPUT DISABLE WITHOUT GATING THE CLOCK GATED OUTPUT CONTROL LINES FOR ENABLING OR DISABLING THE OUTPUTS BUFFERED INPUTS AND OUTPUTS QUIESCENT CURRENT SPECIFIED UP TO 20V 5V, 10V AND 15V PARAMETRIC RATINGS INPUT LEAKAGE CURRENT II = 100nA (MAX) AT VDD = 18V TA = 25C 100% TESTED FOR QUIESCENT CURRENT MEETS ALL REQUIREMENTS OF JEDEC JESD13B "STANDARD SPECIFICATIONS FOR DESCRIPTION OF B SERIES CMOS DEVICES"
DIP
SOP
ORDER CODES
PACKAGE DIP SOP TUBE HCF4076BEY HCF4076BM1 T&R HCF4076M013TR
DESCRIPTION HCF4076B is a monolithic integrated circuit fabricated in Metal Oxide Semiconductor technology available in DIP and SOP packages. HCF4076B is a four bit register consisting of D-TYPE flip-flops that feature three state outputs. Data Disable inputs are provided to control the entry of data into the flip-flops. When both Data
Disable inputs are low, data at the D inputs are loaded into their respective flip-flops on the next positive transition of the clock input. Output Disable inputs are also provided. When the Output Disable inputs are both low, the normal logic states of the four outputs are available to the load. The outputs are disabled independently of the clock by a high logic level at either Output Disable input, and present a high impedance.
PIN CONNECTION
September 2002
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HCF4076B
IINPUT EQUIVALENT CIRCUIT PIN DESCRIPTION
PIN No 14, 13, 12, 11 10, 9 1, 2 7 15 8 16 SYMBOL DATA1 to DATA 4 G1, G2 M, N CLOCK RESET VSS VDD NAME AND FUNCTION D Inputs Data Input Disable Control Output Disable Control Clock Input Reset Input Negative Supply Voltage Positive Supply Voltage
TRUTH TABLE
DATA INPUT DISABLE RESET H L L L L L L L H CLOCK G1 X L X X H X L L X X G2 X X X H L L X X X X X X H L X X DATA D NEXT STATE OUTPUT L Q Q Q H L Q Q NO CHANGE NO CHANGE
NO CHANGE NO CHANGE NO CHANGE
X : Don't Care When either Output Disable M or N is high, the outputs are disabled (high impedance state) : however sequential operation of the flip-flop is not affected.
FUNCTIONAL DIAGRAM
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HCF4076B
LOGIC DIAGRAM
ABSOLUTE MAXIMUM RATINGS
Symbol VDD VI II PD Top Tstg Supply Voltage DC Input Voltage DC Input Current Power Dissipation per Package Power Dissipation per Output Transistor Operating Temperature Storage Temperature Parameter Value -0.5 to +22 -0.5 to VDD + 0.5 10 200 100 -55 to +125 -65 to +150 Unit V V mA mW mW C C
Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is not implied. All voltage values are referred to VSS pin voltage.
RECOMMENDED OPERATING CONDITIONS
Symbol VDD VI Top Supply Voltage Input Voltage Operating Temperature Parameter Value 3 to 20 0 to VDD -55 to 125 Unit V V C
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HCF4076B
DC SPECIFICATIONS
Test Condition Symbol Parameter VI (V) 0/5 0/10 0/15 0/20 0/5 0/10 0/15 5/0 10/0 15/0 0.5/4.5 1/9 1.5/13.5 4.5/0.5 9/1 13.5/1.5 2.5 4.6 9.5 13.5 0.4 0.5 1.5 VO (V) |IO| VDD (A) (V) 5 10 15 20 5 10 15 5 10 15 5 10 15 5 10 15 5 5 10 15 5 10 15 18 18 Any Input TA = 25C Min. Typ. 0.04 0.04 0.04 0.08 4.95 9.95 14.95 0.05 0.05 0.05 3.5 7 11 1.5 3 4 -1.36 -0.44 -1.1 -3.0 0.44 1.1 3.0 -3.2 -1 -2.6 -6.8 1 2.6 6.8 10-5 10-4 5 -1.1 -0.36 -0.9 -2.4 0.36 0.9 2.4 3.5 7 11 1.5 3 4 -1.1 -0.36 -0.9 -2.4 0.36 0.9 2.4 Max. 5 10 20 100 4.95 9.95 14.95 0.05 0.05 0.05 3.5 7 11 1.5 3 4 Value -40 to 85C Min. Max. 150 300 600 3000 4.95 9.95 14.95 0.05 0.05 0.05 -55 to 125C Min. Max. 150 300 600 3000 Unit
IL
Quiescent Current
A
VOH
High Level Output Voltage Low Level Output Voltage High Level Input Voltage Low Level Input Voltage Output Drive Current
VOL
VIH
VIL
IOH
IOL
Output Sink Current Input Leakage Current 3-State Output Current Input Capacitance
0/5 0/5 0/10 0/15 0/5 0/10 0/15 0/18 0/18
<1 <1 <1 <1 <1 <1 <1 <1 <1 <1 <1 <1 <1 <1 <1 <1 <1 <1 <1
V
V
V
V
mA
mA
II
Any Input
0.1 0.4
7.5
1 12
1 12
A A
pF
IOZ CI
The Noise Margin for both "1" and "0" level is: 1V min. with VDD =5V, 2V min. with VDD=10V, 2.5V min. with VDD=15V
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HCF4076B
DYNAMIC ELECTRICAL CHARACTERISTICS (Tamb = 25C, CL = 50pF, RL = 200K, tr = tf = 20 ns)
Test Condition Symbol Parameter VDD (V) 5 10 15 5 10 15 5 10 15 5 10 15 5 10 15 5 10 15 5 10 15 5 10 15 5 10 15 5 10 15 Min. Value (*) Typ. 300 125 90 230 100 75 150 75 60 150 75 60 100 50 40 60 25 20 100 40 30 90 50 35 6 12 16 Max. 600 250 180 460 200 150 300 150 120 300 150 120 ns Unit
tPLH tPHL Propagation Delay Time (Clock to Q Output) tPHL(R) Propagation Delay Time (Reset) 3-State Out H or L to High Impedance 3-State High Impedance to H or L Output Clock Pulse Width
ns
tP(1-H)
RL = 1K
ns
tP(L-1)
RL = 1K 200 100 80 120 50 40 200 80 60 180 100 70 3 6 8 15 5 5
ns
tW
ns
tW
Reset Pulse Width
ns
tsetup
Data Setup Time
ns
tsetup
Data Input Disable Setup Time
ns
fmax
Maximum Clock Frequency
MHz
tr, tf
Clock input Rise or Fall Time
s
(*) Typical temperature coefficient for all VDD value is 0.3 %/C.
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HCF4076B
TEST CIRCUIT
TEST tPLH, tPHL tPZL, tPLZ tPZH, tPHZ
CL = 50pF or equivalent (includes jig and probe capacitance) RL = 200K RT = ZOUT of pulse generator (typically 50)
SWITCH Open VDD VSS
WAVEFORM : PROPAGATION DELAY TIMES (f=1MHz; 50% duty cycle)
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HCF4076B
Plastic DIP-16 (0.25) MECHANICAL DATA
mm. DIM. MIN. a1 B b b1 D E e e3 F I L Z 3.3 1.27 8.5 2.54 17.78 7.1 5.1 0.130 0.050 0.51 0.77 0.5 0.25 20 0.335 0.100 0.700 0.280 0.201 1.65 TYP MAX. MIN. 0.020 0.030 0.020 0.010 0.787 0.065 TYP. MAX. inch
P001C
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HCF4076B
SO-16 MECHANICAL DATA
DIM. A a1 a2 b b1 C c1 D E e e3 F G L M S 3.8 4.6 0.5 9.8 5.8 1.27 8.89 4.0 5.3 1.27 0.62 8 (max.) 0.149 0.181 0.019 10 6.2 0.35 0.19 0.5 45 (typ.) 0.385 0.228 0.050 0.350 0.157 0.208 0.050 0.024 0.393 0.244 0.1 mm. MIN. TYP MAX. 1.75 0.2 1.65 0.46 0.25 0.013 0.007 0.019 0.003 MIN. inch TYP. MAX. 0.068 0.007 0.064 0.018 0.010
PO13H
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HCF4076B
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics. (c) The ST logo is a registered trademark of STMicroelectronics (c) 2002 STMicroelectronics - Printed in Italy - All Rights Reserved STMicroelectronics GROUP OF COMPANIES Australia - Brazil - Canada - China - Finland - France - Germany - Hong Kong - India - Israel - Italy - Japan - Malaysia - Malta - Morocco Singapore - Spain - Sweden - Switzerland - United Kingdom - United States. (c) http://www.st.com
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